Part 1: Scanning Tunneling Microscopy and its applications, near-field microscopies instrumentation
Chapter 1: Physics of quantum tunneling Chapter 2: STM instrumentation and operation Chapter 3: Selected application examples of STM
Part 2: Atomic Force Microscopy and related techniques
Chapter 1: Principles of AFM Reviews of the force acting at nanoscale, short historical presentation of the main scientists involved in the NFM development. Probe fabrication and properties, description of the instrument Chapter 2: Imaging modes Contact and friction modes, dynamic mode. For each mode, examples are provided to illustrate the wide range of applications of these modes. Presentation of the common artifacts of AFM technique and its limitations (force and lateral resolutions) Chapter 3: Spectroscopy mode Force curves and related interaction measurements, Force mapping Chapter 4: Introduction to Electric Force Microscopy Electrostatic Force Microscopy, Kelvin Probe Microscopy, Scanning capacitance microscopy. For each electrical mode, examples from research publications are provided and discussed. Chapter 5: AFM as a local tool Introduction to Scanning Force Lithography with a specific emphasis on Nano-oxidation and Nano-xerography.