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Advanced microscopy - 4PMTAMA2

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  • Number of hours

    • Lectures : 16.0
    • Tutorials : 4.0
    • Laboratory works : ?
    • Projects : ?
    • Internship : ?
    ECTS : 2.0

Goals

To have general knowledge of scanning microscopies and understand the physics behind their operation
To have a broad understanding of the most important applications of scanning probe microscopies

Contact Clemens WINKELMANN, Hermann SELLIER

Content

Part 1: Scanning Tunneling Microscopy and its applications, near-field microscopies instrumentation

Chapter 1: Scanning Tunneling Microscopy
Refresher on the free electron model in a metal, including the work-function
Basics on electron tunneling through a square barrier
Field emission in the framework of the WKB approximation
Microscopic model of tunneling
Expression of the tunnel current as a function of the density of states and electronic distribution function
General description of STM
Chapter 2: Instrumentation for Scanning Probe Microscopy
Piezo-electricity
Scanning and coarse displacements
Tunnel tips
Vibration isolation
General design of scanning probe microscopes
Schematics of the detection and regulation scheme, PID regulation
Chapter 3: STM imaging of surfaces
Constant and constant height modes
Origin of the atomic contrast
The corrugation
Chemical contrast, example of GaGs
The case of graphite
Chapter 4: Scanning tunneling spectroscopy of nano-objects and nanostructures
Principles of local spectroscopy and spectroscopic imaging
Vortices in a superconductor, superconducting diamond
Inelastic tunneling spectroscopy,
Graphene: general introduction, local doping and quasi-particle interference
Carbon nanotubes: general introduction, relation between structure and structure
Spin-resolved STM.
Chapter 5: Nanomanipulation
AFM nano-lithography
Single atom manipulation
Electronic surface states, example of quantum corrals
Tip-induced molecule movement and chemical reaction
Chapter 6: New local probes
Combined AFM-STM
µ-SQUID imaging, …

Part 2: Atomic Force Microscopy and related techniques

Chapter 1: Principles of AFM
Reviews of the force acting at nanoscale, short historical presentation of the main scientists involved in the NFM development.
Probe fabrication and properties, description of the instrument
Chapter 2: Imaging modes
Contact and friction modes, dynamic mode.
For each mode, examples are provided to illustrate the wide range of applications of these modes.
Presentation of the common artifacts of AFM technique and its limitations (force and lateral resolutions)
Chapter 3: Spectroscopy mode
Force curves and related interaction measurements, Force mapping
Chapter 4: Introduction to Electric Force Microscopy
Electrostatic Force Microscopy, Kelvin Probe Microscopy, Scanning capacitance microscopy. For each electrical mode, examples from research publications are provided and discussed.
Chapter 5: AFM as a local tool
Introduction to Scanning Force Lithography with a specific emphasis on Nano-oxidation and Nano-xerography.



Prerequisites

Quantum mechanics, solid-state physics, Basic mechanics

Tests

Semester 8 - The exam is given in english only 

Oral exam with no document



Additional Information

Semester 8 - This course is given in english only EN

Curriculum->NANOTECH->Semester 8

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Date of update March 13, 2019

Grenoble INP Institut d'ingénierie Univ. Grenoble Alpes