Design for test - WPMWDFT7

Goal(s)

This teaching module provides a comprehensive description of test methods for RF ICs

Content(s)

Introduction to RF production testing (What is test? Characterization vs. verification vs. production testing; IC testing methodology, objectives, challenges; Modeling the cost of test); Current industrial practice for RF testing (Testing RF stand-alone ICs: basic measurements such as power, noise, gain, linearity, S-parameters for low noise amplifiers, mixers, power amplifiers, etc; Testing RF transceivers: receiver and transmitter tests); Advanced test techniques (Design for Test (DfT) solutions; Built-In Self-Test (BIST) solutions; Practical case studies: loopback test, RF power detectors, envelope detectors, current sensors, non-intrusive process monitors, temperature sensors, etc); State-of-the-art research papers reading and discussion.

Basics in RF and RF ICs.