School of engineering in Physics, Applied Physics, Electronics & Materials
Control of composition, structure and microstructure is a key point to process materials with optimized properties. The aim of this course is to give an overview of analytical and microstructural characterization techniques in materials science. The specificity of each technique will be emphasized, in terms of kind of information which is supplied, scale of analysis, resolution and sensitivity. Courses will be illustrated by examples for the different materials classes.Contact Jean-Michel MISSIAEN
Introduction (4h) : overview of characterisation techniques ; material-radiation interactions
Global characterization (8h) : composition (X-Ray Fluorescence; atomic spectroscopy), chemical binding (IR/Raman spectroscopy, NMR) ; structure (X-Ray and neutrons diffraction).
Characterization of microstructure (8h) : imaging by scanning electron microscopy (SEM) and transmission electron microscopy (TEM); image analysis ; structure, texture and defects (EBSD, electronic diffraction) ; local composition (X-Ray µAnalysis ; electron energy loss spectroscopy).
Characterization of surfaces and thin films (6h) : imaging by scanning probe microscopy ; composition (Auger and photoelectrons spectroscopy, ion beam analyses) ; structure (grazing incidence X-Ray diffraction ; low energy electron diffraction)
Lab. sessions (5x3h out of 8x3h) : Global analysis by ICP ; X-Ray diffraction ; scanning electron microscopy and X-Ray microanalysis ; transmission electron microscopy ; image analysis ; Auger/XPS spectroscopy ; atomic force microscopy ; DSC (polymers).
Basics in atomistics, chemical bonding, electronic properties of solids and cristallography
2h Examination (2/3 of the final mark)
Report on practical work (1/3 of the final mark)
2/3 Examen + 1/3 TP
ASM Handbook, Vol. 10, Materials Characterization.