Phelma Formation 2022

Elaboration of integrated circuits

  • Number of hours

    • Lectures 10.0
    • Tutorials 8.0

    ECTS

    ECTS 2.0

Goal(s)

This course presents the process flow for the elaboration of integrated circuits and microsystems. The material-related issues and the process limitations are also discussed. A failure analysis approach is also performed.

TO SEE FICHE 3A-SIM 5PMMECI1


Contact Fabien VOLPI

Content(s)

General introduction. Presentation of standard process flow in microelectronics. reminders on usual notions (miniaturisation, integration, Front-End, Back-End,...).

A standard CMOS structure is used to illustrate the succesion of process steps.
Each process class is developped in order to point-out their advantage, drawbacks, limitations, state-of-the-art techniques,...

  • Cleaning - Drying
  • Deposition - Growth
  • Photolithography
  • Etching
  • Doping
  • SOI

Specific processes for microsystems (Micro-machining)

TO SEE FICHE 3A-SIM 5PMMECI1



Prerequisites

Teaching methods : Lectures
Language : Classes and assessment in English; Bibliography in English

TO SEE FICHE 3A-SIM 5PMMECI1

Test

The exam is given in english only 

Written exam (usually on scientific article)

TO SEE FICHE 3A-SIM 5PMMECI1



Additional Information

This course is given in english only EN

Course list
Curriculum->Internationals Cursus->Semester 5
Curriculum->Master RI FAME->Semester 5

Bibliography

  • Silicon processing for the VLSI era. (vol.1 & 2), Stanley Wolf, Richard N. Tauber Edition, 2nd ed, Sunset Beach, Calif : Lattice Press (2000)
  • Silicon VLSI Technology: Fundamentals, Practice and Modeling, James D. Plummer, Michael Deal, Peter Griffin, Ed Prentice Hall (2000)
  • The Science and Engineering of Microelectronic Fabrication, Stephen A. Campbell, Ed Oxford University Press Inc, 2nd revised edition (2003)
  • Reliability and Failure of Electronic Materials and Devices, Milton Ohring, Ed Academic Press Inc (1998)
  • Handbook of Semiconductor Manufacturing Technology, Robert Doering, Yoshio Nishi, Ed CRC Press Inc, 2nd Revised edition (2007)