Materials characterization

Goal(s)

The aim of this course is to give an overview of analytical and microstructural characterization techniques in materials science. The specificity of each technique will be emphasized, in terms of kind of information which is supplied, scale of analysis, resolution and sensitivity. Courses will be illustrated by examples for the different materials classes.

TO SEE FICHE 2A-SIM 4PMMCAR9

Content(s)

• Introduction (4h) : overview of characterisation techniques, material-radiation interactions
  Global characterisation (8h) : composition (X-Ray Fluorescence, atomic spectroscopy), chemical binding (IR/Raman spectroscopy, NMR), structure (X-Ray and neutrons diffraction)
• Characterisation of microstructure (8h): imaging by scanning electron microscopy (SEM) and transmission electron microscopy (TEM), image analysis, structure, texture and defects (EBSD, electronic diffraction), local composition (X-Ray Analysis, electron energy loss spectroscopy)
• Characterisation of surfaces and thin films (6h) : imaging by scanning probe microscopy, composition (Auger and photoelectrons spectroscopy, ion beam analyses), structure (grazing incidence X-Ray diffraction, low energy electron diffraction)
• Lab. sessions (6x4h out of 8x4h) : Global analysis by ICP, X-Ray diffraction, scanning electron microscopy and X-Ray microanalysis, transmission electron microscopy, image analysis, Auger/XPS spectroscopy, atomic force microscopy, DSC (polymers)

Teaching methods : 24h Theoretical classes, 2h Problem sessions, 24h Lab. Sessions
Language : Classes and assessment in English, Bibliography in English.