School of engineering in Physics, Applied Physics, Electronics & MaterialsScience
This lecture aims at introducing the required concepts of testability, robustness and low power, as well as advanced VLSI design concepts.
The course will be oriented towards the following aspects:
- DFT design: Scan Path, BIST, Boundary Scan, SOC wrappers for test purposes
- Memory testing and self repair techniques
Examination : 2 h