Materials characterization - 4PMMCAR9

Goal(s)

Control of composition, structure and microstructure is essential for the development of materials with optimized properties. The aim of this course is to provide an overview of analytical and microstructural materials characterization methods. The specificity of each method will be presented, in terms of the type of information provided, the scale of analysis, resolution and sensitivity. We will illustrate with examples applied to different classes of materials. Class sessions are accompanied by labworks on the instruments and practical exercises.

Content(s)

The course is organized as follows:

• Introduction (4h): radiation-matter interaction phenomena, diffraction.
• Global characterization (6h): measurements of composition (X-ray fluorescence; atomic emission/absorption), chemical bonds (IR/Raman spectrometry, NMR). Characterization methods specific to polymers will also be treated.
• Characterization of microstructures by electron microscopy (6h): Scanning and transmission electron microscopy. Study of structure, texture and defects (EBSD, electron diffraction). Study of local compositions (µX-ray analysis; electron energy losses).
• Characterization of surfaces and thin films (6h): near-field microscopy imaging, composition (Auger and photoelectron spectrometry, ion beam analysis), structure (grazing incidence X-ray diffraction, slow electron diffraction).
• X-ray tomography (2h).
  Labworks will cover the themes and instruments covered in class (Scanning Microscopy, Transmission Microscopy, Tomography, X-ray Flurorescence, image analysis, study of crystallographic textures, etc.).

Basics in atomistics, chemical bonding, electronic properties of solids and cristallography