Number of hours
- Lectures 4.0
- Projects 0
- Tutorials 4.0
- Internship 0
- Laboratory works 0
- Written tests 0
ECTS
ECTS 0.75
Goal(s)
This teaching module provides a comprehensive description of test methods for RF ICs
Contact Laurent MONTESContent(s)
Introduction to RF production testing (What is test? Characterization vs. verification vs. production testing; IC testing methodology, objectives, challenges; Modeling the cost of test); Current industrial practice for RF testing (Testing RF stand-alone ICs: basic measurements such as power, noise, gain, linearity, S-parameters for low noise amplifiers, mixers, power amplifiers, etc; Testing RF transceivers: receiver and transmitter tests); Advanced test techniques (Design for Test (DfT) solutions; Built-In Self-Test (BIST) solutions; Practical case studies: loopback test, RF power detectors, envelope detectors, current sensors, non-intrusive process monitors, temperature sensors, etc); State-of-the-art research papers reading and discussion.
Prerequisites
Basics in RF and RF ICs.
Semester 9 - The exam is given in english only
WE=Written Exam
WE=Written Exam
Final mark=100% WE
Semester 9 - This course is given in english only