5PMNFCC0 : Device and circuit reliability - WPMNDFC9

Goal(s)

In the microelectronics reliability context, understand the physics and the laws ruling the main failure mechanisms encountered in integrated circuit reliability, be able to perform a reliability analysis up to lifetime extrapolation based on experimental data

Content(s)

• Reliability context in semiconductor industry
• Reliability basics remindser : reliability analysis basic concepts and tools for microelectronics reliability
• Focus on main failure mechanisms in modern integrated circuits : phenomenological description and associated physics, methodologies and test structures, process reliability strategy
• Addressed failure mechanisms : Gate Oxide Integrity, Mobile Ion Contamination, Hot-Carrier Injection, Bias Temperature Instability, Electromigration, Stress Migration
• Application exercises

• Semiconductor physics
• Statistics