Informations générales
Number of hours
- Lectures 9.0
- Projects 0
- Tutorials 9.0
- Internship 0
- Laboratory works 0
ECTSECTS
1.5
Goal(s)
Understanding the impact, modeling and characterization of defects in electronic components
Contact Benoit BOULANGER, Quentin RAFHAY, Lionel BASTARDContent(s)
This course details the physics of defects inside electronic components, from a fundamental point of view (modeling, equation), but also through the exposure of methods for characterizing traps, which provide information on the behavior of these defects in components.
Prerequisites
Basic device physics (MOS capa, pn junction, band diagram, semiconductor physics).
Test
2h, based on an article provided beforehand
Additional Information
Course list
Curriculum->Double-Diploma Engineer/Master->Semester 9
Curriculum->Master->Semester 9
Bibliography
SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
Dieter K Schroder