Number of hours
- Lectures 9.0
- Projects 0
- Tutorials 9.0
- Internship 0
- Laboratory works 0
ECTS
ECTS 1.5
Goal(s)
Understanding the impact, modeling and characterization of defects in electronic components
Contact Quentin RAFHAYContent(s)
This course details the physics of defects inside electronic components, from a fundamental point of view (modeling, equation), but also through the exposure of methods for characterizing traps, which provide information on the behavior of these defects in components.
Prerequisites
Basic device physics (MOS capa, pn junction, band diagram, semiconductor physics).
2h, based on an article provided beforehand
Examen écrit Session 1 : DS1
Examen écrit Session 2 : DS2
N1 = Note finale session 1 = 100% DS1
N2 = Note finale session 2 = 100% DS2
SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
Dieter K Schroder