Design for test - WPMWDFT7
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Number of hours
- Lectures : 4.0
- Tutorials : 4.0
- Laboratory works : 0
- Projects : 0
- Internship : 0
- Written tests : 0
ECTS : 0.75
Goals
This teaching module provides a comprehensive description of test methods for RF ICs
Contact Jean Daniel ARNOULD
Content Introduction to RF production testing (What is test? Characterization vs. verification vs. production testing; IC testing methodology, objectives, challenges; Modeling the cost of test); Current industrial practice for RF testing (Testing RF stand-alone ICs: basic measurements such as power, noise, gain, linearity, S-parameters for low noise amplifiers, mixers, power amplifiers, etc; Testing RF transceivers: receiver and transmitter tests); Advanced test techniques (Design for Test (DfT) solutions; Built-In Self-Test (BIST) solutions; Practical case studies: loopback test, RF power detectors, envelope detectors, current sensors, non-intrusive process monitors, temperature sensors, etc); State-of-the-art research papers reading and discussion.
PrerequisitesBasics in RF and RF ICs.
Tests Semester 9 - The exam is given in english only 
WE=Written Exam
WE=Written Exam
Final mark=100% WE
Additional Information This course brings 0.0 ECTS to students in UE 5 Speciality courses (3A SEI)
Semester 9 - This course is given in english only

Curriculum->Double-Diploma Engineer/Master->Semester 9
Curriculum->Engineering degree->Semester 9
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Date of update March 13, 2019