Lab sessions: CAD - 5PMECNA7

Goal(s)

This lecture aims at introducing the required concepts of testability, robustness and low power, as well as advanced VLSI design concepts.

Content(s)

The course will be oriented towards the following aspects :

• Low power VLSI design techniques

• DFM(Y) techniques: problems and solutions

• Fault tolerant design (ECC codes, reconfigurations, etc.)

- DFT design: Scan Path, BIST, Boundary Scan, SOC wrappers for test purposes

- Memory testing and self repair techniques