Informations générales
Number of hours
- Lectures 9.0
- Projects 0
- Tutorials 9.0
- Internship 0
- Laboratory works 0
ECTSECTS
1.5
Goal(s)
This lecture aims at understanding the physics of defects in semiconductor electron devices, at the heart of devices performance loss and degradations. The defects appear in numeros technologies, like CMOS, imagers, detectors etc.
Contact Quentin RAFHAY, Lionel BASTARDContent(s)
- Recalls on basic devices
- Recalls on defects in semiconductors
- Harmonic characterization
- Impulse characterization
- Low frequency noise
Prerequisites
Semiconductor device physics
Test
Semester 9 - The exam is given in english only 
100% on exam (2h) - documents and calculators authorized
Additional Information
Semester 9 - This course is given in english only 
Course list
Curriculum->Double-Diploma Engineer/Master->Semester 9
Curriculum->IPhy->Semester 9
Bibliography
SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
Dieter K Schroder