Number of hours
- Lectures 12.0
- Projects 0
- Tutorials 10.0
- Internship 0
- Laboratory works 4.0
ECTS
ECTS 1.5
Goal(s)
To understand the physical phenomena which appear in semiconductor materials and are used in microelectronic sensors or devices.
Contact Nathalie MATHIEUContent(s)
• Semiconductor elementary properties at equilibrium (structures, energy bands, electron and hole, doping)
•Weak perturbations of equilibrium : charge transport (conduction, carrier mobility ; diffusion ; Hall effect)
•Poisson equation and consequences (Space Charge Region, potential barrier or well)
•Strong perturbations of equilibrium (carrier generation and recombination)Metal-semiconductor contact, Schottky diode
Prerequisites
Session 1 : written final exam (2h)
Grade Session 1 = 100% Exam
Session 2 : Written exam (2h)
Grade Session 2 = 100% Exam
Session 1 if confinement: Continuous Assessment + written final exam (MCQ + 1h written exam)
Note Session 1 = 20% CA + 80% Exam
Session 2 if confinement : written exam 1h + oral (ZOOM and camera requested)
Note Session 2 = 100% oral
First attempt : Final exam: 2h written exam (COVID or not)
Retake exam : 2h written exam or Oral exam
Contrôle continu : CC
Examen écrit Session1 : DS1
Examen écrit ou oral Session 2 : DS2
1 et 2 après type = session
N1 = Note finale session 1
N2 = Note finale session 2
En présentiel :
N1 = 100% DS1
N2 = 100% DS2
En Anglais:
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S.M. SZE: Semiconductor devices : physics and technology international student version
(3rd Edition, Wiley, 2013) ISBN : 978-0-470-87367-0
Disponible BU Joseph-Fourier, Techniques rdc Sud 621.382 SZE
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S.M. SZE: Physics of semiconductor devices
(3rd Edition, 2007), ISBN : 0-471-14323-5
BU Joseph-Fourier, Recherche étage Sud 537.311.322 SZE
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G. Streetman and S. Banerjee : Solid-state Electronic Devices
(6th Ed., Prentice Hall,2005) ISBN : 0-13-025538-6
En Français:
A. Vapaille et R. Castagné : Dispositifs et circuits intégrés
(Dunod, 1987) ISBN : 2-04-019714-1
Phelma - bibliothèque Salle lecture D00-VAP
H. Mathieu : Physique des semiconducteurs et des composants électroniques
(5eme édition, Dunod, 2004) ISBN : 2-10-048633-0
BU Joseph-Fourier, Techniques rdc Sud 621.38 MAT