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CM : 14.0
TD : 6.0
Crédits ECTS : 1.5
To provide the main concepts and methods used in quality control and reliability improvement
Contact Bruno COMMERE
Control of manufacturing process : Analysis tools, variation causes of a manufacturing process, capability, implementation of SPC (Statistical Process Control), Incoming statistical inspection : Statistics applied to inspection, AQL and LTPD, efficiency curve, inspection plan, FMEA : Failure Mode and Effects Analysis, Qualification: Targets, method, connection to reliability, Reliability : Its application to electronic components and semiconductor technologies. Bathtub curve, life service, failure rate, observed reliability, test plan, intrinsic reliability, laws, accelerated models, extrapolated reliability to use conditions, predicted reliability, Reliability for printed circuit boards and electronic systems : Predicted reliability, MTBF, operating assurance, Reliability improvement : Targets, techniques.